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International Test Conference 2004 (ITC'04)
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
x 
 
"Technical Program Committee," Test Conference, International, pp. 6, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.172,
author = {},
title = {Technical Program Committee},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {6},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.172},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Technical Program Committee
SN - 1089-3539
SP
EP
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Citation:
"Technical Program Committee," itc, pp.6, International Test Conference 2004 (ITC'04), 2004
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