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International Test Conference 2004 (ITC'04)
A Model-based Test Approach for Testing High-Speed PLLs and Phase Regulation Circuitry in SOC Devices
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
x 
 
Bernd Laquai, "A Model-based Test Approach for Testing High-Speed PLLs and Phase Regulation Circuitry in SOC Devices," Test Conference, International, pp. 764-772, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.17,
author = {Bernd Laquai},
title = {A Model-based Test Approach for Testing High-Speed PLLs and Phase Regulation Circuitry in SOC Devices},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {764-772},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.17},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - A Model-based Test Approach for Testing High-Speed PLLs and Phase Regulation Circuitry in SOC Devices
SN - 1089-3539
SP764
EP772
A1 - Bernd Laquai,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Bernd Laquai, Agilent Technologies, Boeblingen, Germany
Citation:
Bernd Laquai, "A Model-based Test Approach for Testing High-Speed PLLs and Phase Regulation Circuitry in SOC Devices," itc, pp.764-772, International Test Conference 2004 (ITC'04), 2004
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