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International Test Conference 2004 (ITC'04)
System Monitor for Diagnostic, Calibration and System Configuration
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
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Maurizio Gavardoni, Michael Jones, Russell Poffenberger, Miguel Conde, "System Monitor for Diagnostic, Calibration and System Configuration," Test Conference, International, pp. 1263-1268, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.169,
author = {Maurizio Gavardoni and Michael Jones and Russell Poffenberger and Miguel Conde},
title = {System Monitor for Diagnostic, Calibration and System Configuration},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {1263-1268},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.169},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Test Conference, International
TI - System Monitor for Diagnostic, Calibration and System Configuration
SN - 1089-3539
SP1263
EP1268
A1 - Maurizio Gavardoni,
A1 - Michael Jones,
A1 - Russell Poffenberger,
A1 - Miguel Conde,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Maurizio Gavardoni, Credence Systems Corporation, San Jose, CA
Michael Jones, Credence Systems Corporation, San Jose, CA
Russell Poffenberger, Credence Systems Corporation, San Jose, CA
Miguel Conde, Credence Systems Corporation, Cedex - France
This paper describes an efficient system monitoring mechanism (hardware and software) suitable for instrumentation within a configurable tester. The mechanism includes traditional voltage and temperature monitoring as well as power control, configuration management and FPGA download.
Citation:
Maurizio Gavardoni, Michael Jones, Russell Poffenberger, Miguel Conde, "System Monitor for Diagnostic, Calibration and System Configuration," itc, pp.1263-1268, International Test Conference 2004 (ITC'04), 2004
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