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International Test Conference 2004 (ITC'04)
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
x 
 
Kenneth M. Butler, "Sure You Can Get to 100 DPPM in Deep Submicron, But It?ll Cost Ya," Test Conference, International, pp. 1419, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.168,
author = {Kenneth M. Butler},
title = {Sure You Can Get to 100 DPPM in Deep Submicron, But It?ll Cost Ya},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {1419},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.168},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Sure You Can Get to 100 DPPM in Deep Submicron, But It?ll Cost Ya
SN - 1089-3539
SP
EP
A1 - Kenneth M. Butler,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Kenneth M. Butler, Texas Instruments Inc.
As we continue the steady march towards smaller and smaller geometries, lower operating voltages, and more and more layers of metal, in the war on bad devices, the rules of engagement are changing. It?s not so much a drastic shift in the types of defects we observe, but that the union of the set of all possible sources of "bad behavior" is increasingly larger.
Citation:
Kenneth M. Butler, "Sure You Can Get to 100 DPPM in Deep Submicron, But It?ll Cost Ya," itc, pp.1419, International Test Conference 2004 (ITC'04), 2004
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