SPIN-SIM: Logic and Fault Simulation for Speed-Independent Circuits

I
ITC
2004
International Test Conference 2004 (ITC'04)
Abstract - SPIN-SIM: Logic and Fault Simulation for Speed-Independent Circuits

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International Test Conference 2004 (ITC'04)

Charlotte, NC, USA

October 26-October 28

ISBN: 0-7803-8581-0

	ASCII Text	x
	Feng Shi, Yiorgos Makris, "SPIN-SIM: Logic and Fault Simulation for Speed-Independent Circuits," Test Conference, International, pp. 597-606, International Test Conference 2004 (ITC'04), 2004.

	BibTex	x
	@article{ 10.1109/ITC.2004.165, author = {Feng Shi and Yiorgos Makris}, title = {SPIN-SIM: Logic and Fault Simulation for Speed-Independent Circuits}, journal ={Test Conference, International}, volume = {0}, year = {2004}, issn = {1089-3539}, pages = {597-606}, doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.165}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - SPIN-SIM: Logic and Fault Simulation for Speed-Independent Circuits SN - 1089-3539 SP597 EP606 A1 - Feng Shi, A1 - Yiorgos Makris, PY - 2004 KW - null VL - 0 JA - Test Conference, International ER -

Feng Shi, Yale University New Haven, CT

Yiorgos Makris, Yale University New Haven, CT

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ITC.2004.165

We present SPIN-SIM, a logic and fault simulator for Speed-Independent Circuits, that extends the classical Eichelberger?s method and overcomes its limitations. In order to improve simulation accuracy, SPIN-SIM adopts a 13- valued algebra, maintains the relative order of causal signal transitions, and unfolds time frames judiciously. In addition, complex gates are handled through replacement by pseudo-gate equivalents with regards to functionality, timing and faulty behavior. Experimental results show that SPIN-SIM incurs a negligible increase in computational time over Eichelberger?s method, yet is much more accurate and achieves a significant improvement in fault coverage.

Citation:

Feng Shi, Yiorgos Makris, "SPIN-SIM: Logic and Fault Simulation for Speed-Independent Circuits," itc, pp.597-606, International Test Conference 2004 (ITC'04), 2004

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