RF TESTING ON A MIXED SIGNAL TESTER

I
ITC
2004
International Test Conference 2004 (ITC'04)
Abstract - RF TESTING ON A MIXED SIGNAL TESTER

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International Test Conference 2004 (ITC'04)

Charlotte, NC, USA

October 26-October 28

ISBN: 0-7803-8581-0

	ASCII Text	x
	Dana Brown, John Ferrario, Randy Wolf, Jing Li, Jayendra Bhagat, "RF TESTING ON A MIXED SIGNAL TESTER," Test Conference, International, pp. 793-800, International Test Conference 2004 (ITC'04), 2004.

	BibTex	x
	@article{ 10.1109/ITC.2004.154, author = {Dana Brown and John Ferrario and Randy Wolf and Jing Li and Jayendra Bhagat}, title = {RF TESTING ON A MIXED SIGNAL TESTER}, journal ={Test Conference, International}, volume = {0}, year = {2004}, issn = {1089-3539}, pages = {793-800}, doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.154}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - RF TESTING ON A MIXED SIGNAL TESTER SN - 1089-3539 SP793 EP800 A1 - Dana Brown, A1 - John Ferrario, A1 - Randy Wolf, A1 - Jing Li, A1 - Jayendra Bhagat, PY - 2004 KW - null VL - 0 JA - Test Conference, International ER -

Dana Brown, IBM Corporation Essex Junction, VT, USA

John Ferrario, IBM Corporation Essex Junction, VT, USA

Randy Wolf, IBM Corporation Essex Junction, VT, USA

Jing Li, IBM Corporation Essex Junction, VT, USA

Jayendra Bhagat, IBM Corporation Essex Junction, VT, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ITC.2004.154

In this paper, testing of radio frequency (RF) devices with mixed-signal testers is discussed. General purpose automatic test equipment (ATE) will be used for this. A global positioning system (GPS) device is used as the example to illustrate how to develop the RF test plan with this usage. The test plan developed includes fast, costeffective and dedicated circuitry.

Citation:

Dana Brown, John Ferrario, Randy Wolf, Jing Li, Jayendra Bhagat, "RF TESTING ON A MIXED SIGNAL TESTER," itc, pp.793-800, International Test Conference 2004 (ITC'04), 2004

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