loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
International Test Conference 2004 (ITC'04)
RF TESTING ON A MIXED SIGNAL TESTER
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
x 
 
Dana Brown, John Ferrario, Randy Wolf, Jing Li, Jayendra Bhagat, "RF TESTING ON A MIXED SIGNAL TESTER," Test Conference, International, pp. 793-800, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
x
 
@article{ 10.1109/ITC.2004.154,
author = {Dana Brown and John Ferrario and Randy Wolf and Jing Li and Jayendra Bhagat},
title = {RF TESTING ON A MIXED SIGNAL TESTER},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {793-800},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.154},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - RF TESTING ON A MIXED SIGNAL TESTER
SN - 1089-3539
SP793
EP800
A1 - Dana Brown,
A1 - John Ferrario,
A1 - Randy Wolf,
A1 - Jing Li,
A1 - Jayendra Bhagat,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Dana Brown, IBM Corporation Essex Junction, VT, USA
John Ferrario, IBM Corporation Essex Junction, VT, USA
Randy Wolf, IBM Corporation Essex Junction, VT, USA
Jing Li, IBM Corporation Essex Junction, VT, USA
Jayendra Bhagat, IBM Corporation Essex Junction, VT, USA
In this paper, testing of radio frequency (RF) devices with mixed-signal testers is discussed. General purpose automatic test equipment (ATE) will be used for this. A global positioning system (GPS) device is used as the example to illustrate how to develop the RF test plan with this usage. The test plan developed includes fast, costeffective and dedicated circuitry.
Citation:
Dana Brown, John Ferrario, Randy Wolf, Jing Li, Jayendra Bhagat, "RF TESTING ON A MIXED SIGNAL TESTER," itc, pp.793-800, International Test Conference 2004 (ITC'04), 2004
Usage of this product signifies your acceptance of the Terms of Use.