International Test Conference 2004 (ITC'04) Reducing Power Consumption in Memory ECC Checkers Charlotte, NC, USA October 26-October 28 ISBN: 0-7803-8581-0
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ITC.2004.152
In this paper, a method is proposed for reducing power consumption in memory ECC checker circuitry that provides SEC-DED. The degrees of freedom in selecting the parity check matrix are used to minimize power with little or no impact on area and delay. The power minimization method is applied to two popular SEC-DED codes: standard Hamming codes and odd-column-weight Hsiao codes. Experiments on actual memory traces of Spec and MediaBench benchmarks indicate that considering power in addition to area and delay when selecting the parity check matrix can result in power reductions of up to 27% for Hsiao codes and up to 41% for Hamming codes.
Citation:
Shalini Ghosh, Nur A. Touba, Sugato Basu, "Reducing Power Consumption in Memory ECC Checkers," itc, pp.1322-1331, International Test Conference 2004 (ITC'04), 2004 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||