Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment without Increasing Test Time

I
ITC
2004
International Test Conference 2004 (ITC'04)
Abstract - Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment without Increasing Test Time

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International Test Conference 2004 (ITC'04)

Charlotte, NC, USA

October 26-October 28

ISBN: 0-7803-8581-0

	ASCII Text	x
	C. Taillefer, G.W. Roberts, "Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment without Increasing Test Time," Test Conference, International, pp. 953-962, International Test Conference 2004 (ITC'04), 2004.

	BibTex	x
	@article{ 10.1109/ITC.2004.151, author = {C. Taillefer and G.W. Roberts}, title = {Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment without Increasing Test Time}, journal ={Test Conference, International}, volume = {0}, year = {2004}, issn = {1089-3539}, pages = {953-962}, doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.151}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment without Increasing Test Time SN - 1089-3539 SP953 EP962 A1 - C. Taillefer, A1 - G.W. Roberts, PY - 2004 KW - null VL - 0 JA - Test Conference, International ER -

C. Taillefer, McGill University, Canada

G.W. Roberts, McGill University, Canada

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ITC.2004.151

Noise, especially clock jitter effects, in a DSPbased mixed-signal test system severely limits its measurement accuracy. This is especially acute in high-frequency sampling systems. This paper illustrates an efficient method to improve measurement accuracy and precision by reducing the uncertainty of a DSP-based measurement without an increase in test time. A new digitizer architecture is introduced. The digitizer was fabricated in a 0.18 ?m CMOS process. Experimental results were obtained validating the proposed technique.

Citation:

C. Taillefer, G.W. Roberts, "Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment without Increasing Test Time," itc, pp.953-962, International Test Conference 2004 (ITC'04), 2004

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