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International Test Conference 2004 (ITC'04)
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
x 
 
Phil Nigh, "Redefining ATE: "Data Collection Engines that Drive Yield Learning and Process Optimization"," Test Conference, International, pp. 1429, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.150,
author = {Phil Nigh},
title = {Redefining ATE: "Data Collection Engines that Drive Yield Learning and Process Optimization"},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {1429},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.150},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Redefining ATE: "Data Collection Engines that Drive Yield Learning and Process Optimization"
SN - 1089-3539
SP
EP
A1 - Phil Nigh,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Phil Nigh, IBM Technology and Systems Group Essex Junction, VT
A top priority for IC producers is achieving high yields - particularly early in the product lifetime. "Yield learning rate" (on real products) is the key differentiator among IC suppliers. Testing must play a larger role in driving yield learning-which will change testing methods, ATE requirements and how the IC business views the value of testing.
Citation:
Phil Nigh, "Redefining ATE: "Data Collection Engines that Drive Yield Learning and Process Optimization"," itc, pp.1429, International Test Conference 2004 (ITC'04), 2004
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