Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions

I
ITC
2004
International Test Conference 2004 (ITC'04)
Abstract - Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions

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International Test Conference 2004 (ITC'04)

Charlotte, NC, USA

October 26-October 28

ISBN: 0-7803-8581-0

	ASCII Text	x
	Phil Nigh, Anne Gattiker, "Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions," Test Conference, International, pp. 309-318, International Test Conference 2004 (ITC'04), 2004.

	BibTex	x
	@article{ 10.1109/ITC.2004.148, author = {Phil Nigh and Anne Gattiker}, title = {Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions}, journal ={Test Conference, International}, volume = {0}, year = {2004}, issn = {1089-3539}, pages = {309-318}, doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.148}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions SN - 1089-3539 SP309 EP318 A1 - Phil Nigh, A1 - Anne Gattiker, PY - 2004 KW - null VL - 0 JA - Test Conference, International ER -

Phil Nigh, IBM Technology and Systems Group

Anne Gattiker, IBM Austin Research Lab

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ITC.2004.148

This paper demonstrates IDDQ signature analysis of random and systematic defects, including yield detractors and reliability defects. Application is demonstrated for both understanding failure root cause and guiding test decisions.

Citation:

Phil Nigh, Anne Gattiker, "Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions," itc, pp.309-318, International Test Conference 2004 (ITC'04), 2004

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