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International Test Conference 2004 (ITC'04)
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
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Thomas W. Bartenstein, "Panel 9 - Diagnostics vs. Failure Analysis," Test Conference, International, pp. 1439, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.137,
author = {Thomas W. Bartenstein},
title = {Panel 9 - Diagnostics vs. Failure Analysis},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {1439},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.137},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Test Conference, International
TI - Panel 9 - Diagnostics vs. Failure Analysis
SN - 1089-3539
SP
EP
A1 - Thomas W. Bartenstein,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Thomas W. Bartenstein, Cadence Design Inc., Endicott, NY
What is the opportunity for diagnostic tools and Physical Failure Analysis (PFA)? Why is the opportunity so hard to perceive? If PFA labs and Diagnostics Tool Developers talked to each other, what improvements could be made? What paradigm shifts are on the horizon?
Citation:
Thomas W. Bartenstein, "Panel 9 - Diagnostics vs. Failure Analysis," itc, pp.1439, International Test Conference 2004 (ITC'04), 2004
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