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International Test Conference 2004 (ITC'04)
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
x 
 
John C. Johnson, "Options for High-Volume Test of Multi-GB/s Ports," Test Conference, International, pp. 1435, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
x
 
@article{ 10.1109/ITC.2004.136,
author = {John C. Johnson},
title = {Options for High-Volume Test of Multi-GB/s Ports},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {1435},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.136},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Test Conference, International
TI - Options for High-Volume Test of Multi-GB/s Ports
SN - 1089-3539
SP
EP
A1 - John C. Johnson,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
John C. Johnson, Intel Corporation, Test Platform Architecture and Development
Devices with multi-GB/s ports from a variety of suppliers are shipping in high-volume today. Common port standards such as PCI Express are proliferating along with specialty ports. Characteristics include low-voltage differential swing, point-topoint connection, and unidirectional signaling. While the serial bit stream is organized differently by the various port protocols, the address/data/instruction information is generally contained as a packet. A pair of transmit/receive differential signals (4 wires) constitutes a ?lane?. The number of lanes in multi-GB/s port can usually be scaled to increase bandwidth.
Citation:
John C. Johnson, "Options for High-Volume Test of Multi-GB/s Ports," itc, pp.1435, International Test Conference 2004 (ITC'04), 2004
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