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International Test Conference 2004 (ITC'04)
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
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Takahiro J. Yamaguchi, "Loopback or not?," Test Conference, International, pp. 1434, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.116,
author = {Takahiro J. Yamaguchi},
title = {Loopback or not?},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {1434},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.116},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Test Conference, International
TI - Loopback or not?
SN - 1089-3539
SP
EP
A1 - Takahiro J. Yamaguchi,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Takahiro J. Yamaguchi, Advantest Laboratories, Ltd., Sendai, Miyagi, Japan
Issues in design verification of high-speed serial I/O devices. The increasing data rate of high-speed I/O devices makes currently available measurement tools such as realtime oscilloscopes obsolete. Measuring jitter performance of prototyped physical layer ICs of 5 Gb/s will particularly become a critical problem using current-mainstream oscilloscope technology. Therefore, the architecture of oscilloscopes has to be changed from a high-speed ADCcentric to an equivalent-time (ET) sampling architecture in order to provide the capabilities necessary for measuring signal integrity at and above 5 Gb/s. It is well known that the ET sampling architecture has several disadvantages [1]:
Citation:
Takahiro J. Yamaguchi, "Loopback or not?," itc, pp.1434, International Test Conference 2004 (ITC'04), 2004
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