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International Test Conference 2004 (ITC'04)
Jitter Models and Measurement Methods for High-Speed Serial Interconnects
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
x 
 
Andy Kuo, Touraj Farahmand, Nelson Ou, Andre Ivanov, Sassan Tabatabaei, "Jitter Models and Measurement Methods for High-Speed Serial Interconnects," Test Conference, International, pp. 1295-1302, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
x
 
@article{ 10.1109/ITC.2004.112,
author = {Andy Kuo and Touraj Farahmand and Nelson Ou and Andre Ivanov and Sassan Tabatabaei},
title = {Jitter Models and Measurement Methods for High-Speed Serial Interconnects},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {1295-1302},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.112},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Jitter Models and Measurement Methods for High-Speed Serial Interconnects
SN - 1089-3539
SP1295
EP1302
A1 - Andy Kuo,
A1 - Touraj Farahmand,
A1 - Nelson Ou,
A1 - Andre Ivanov,
A1 - Sassan Tabatabaei,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Andy Kuo, University of British Columbia
Touraj Farahmand, University of British Columbia
Nelson Ou, University of British Columbia
Andre Ivanov, University of British Columbia
Sassan Tabatabaei, Guide Technology, Sunnyvale, CA
Jitter can be decomposed into several subcomponents, each having specific sets of characteristics and root-causes. This paper focuses on describing causes and measurement methods of jitter subcomponents. We first describe the relationship between a jitter PDF and bit error rate (BER) followed by a discussion on what causes jitter. Common jitter measurement methods are presented, along with an analysis of their respective advantages and disadvantages. Our recent research on the cause and practical measurement results and design issues of bounded uncorrelated jitter (BUJ), a subcomponent of jitter, due to crosstalk, is also presented.
Citation:
Andy Kuo, Touraj Farahmand, Nelson Ou, Andre Ivanov, Sassan Tabatabaei, "Jitter Models and Measurement Methods for High-Speed Serial Interconnects," itc, pp.1295-1302, International Test Conference 2004 (ITC'04), 2004
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