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International Test Conference 2004 (ITC'04)
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
x 
 
Mike Li, "Is "Design to Production" The Ultimate Answer For Jitter, Noise, and BER Challenges For Multi GB/s ICs?," Test Conference, International, pp. 1433, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.108,
author = {Mike Li},
title = {Is "Design to Production" The Ultimate Answer For Jitter, Noise, and BER Challenges For Multi GB/s ICs?},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {1433},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.108},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Is "Design to Production" The Ultimate Answer For Jitter, Noise, and BER Challenges For Multi GB/s ICs?
SN - 1089-3539
SP
EP
A1 - Mike Li,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Mike Li, Wavecrest, San Jose, CA
In ITC 2003, a panel entitled "Multi-GB/s IC Test Challenges and Solutions" was successfully conducted with the panelists came from IC manufacture, test and measurement, and ATE industries and academies. Outstanding questions and possible solutions were discussed and debated, including: a.) what needs to be tested in production and why? b.) what will be the suitable test platform: ATE, or open architecture (OA) with module instruments, or DFT/BIST, or combination between them? c.) what constitutes a correct jitter/signal integrity testing method? d) how can we test bit error rate (BER) down to 10-12 within seconds? etc.
Citation:
Mike Li, "Is "Design to Production" The Ultimate Answer For Jitter, Noise, and BER Challenges For Multi GB/s ICs?," itc, pp.1433, International Test Conference 2004 (ITC'04), 2004
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