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International Test Conference 2000 (ITC'00)
Atlantic City, NJ, USA
October 03-October 05
ISBN: 0-7803-6546-1
ASCII Text
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"Technical Program Committee," Test Conference, International, pp. 4, International Test Conference 2000 (ITC'00), 2000.
 
 
BibTex
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@article{ 10.1109/ITC.2000.10045,
author = {},
title = {Technical Program Committee},
journal ={Test Conference, International},
volume = {0},
year = {2000},
issn = {1089-3539},
pages = {4},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2000.10045},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Test Conference, International
TI - Technical Program Committee
SN - 1089-3539
SP
EP
PY - 2000
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Citation:
"Technical Program Committee," itc, pp.4, International Test Conference 2000 (ITC'00), 2000
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