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IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05)
Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume
Tampa, Florida
May 11-May 12
ISBN: 0-7695-2365-X
ASCII Text
x 
 
Il-Soo Lee, Jae Hoon Jeong, Anthony P. Ambler, "Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume," VLSI, IEEE Computer Society Annual Symposium on, pp. 194-199, IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05), 2005.
 
 
BibTex
x
 
@article{ 10.1109/ISVLSI.2005.75,
author = {Il-Soo Lee and Jae Hoon Jeong and Anthony P. Ambler},
title = {Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume},
journal ={VLSI, IEEE Computer Society Annual Symposium on},
volume = {0},
year = {2005},
isbn = {0-7695-2365-X},
pages = {194-199},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISVLSI.2005.75},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI, IEEE Computer Society Annual Symposium on
TI - Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume
SN - 0-7695-2365-X
SP194
EP199
A1 - Il-Soo Lee,
A1 - Jae Hoon Jeong,
A1 - Anthony P. Ambler,
PY - 2005
KW - null
VL - 0
JA - VLSI, IEEE Computer Society Annual Symposium on
ER -
 
Il-Soo Lee, University of Texas at Austin
Jae Hoon Jeong, University of Texas at Austin
Anthony P. Ambler, University of Texas at Austin
Using the nonlinear feedback shift register in testing is known to create a test set for combinational circuits instead of using the deterministic test set. The nonlinear property of feedback shift register is used differently here to reduce the test data volume for combinational circuits without using the nonlinear feedback shift register. In addition, a dictionary coding method is applied to further decrease a reduced test set. Results with benchmark circuits show a great improvement in the reduction of test data volume.
Citation:
Il-Soo Lee, Jae Hoon Jeong, Anthony P. Ambler, "Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume," isvlsi, pp.194-199, IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05), 2005
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