Reduction of Power and Test Time by Removing Cluster of Don?t-Care from Test Data Set

I
ISVLSI
2005
IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05)
Abstract - Reduction of Power and Test Time by Removing Cluster of Don?t-Care from Test Data Set

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IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05)

Reduction of Power and Test Time by Removing Cluster of Don?t-Care from Test Data Set (PDF)

Tampa, Florida

May 11-May 12

ISBN: 0-7695-2365-X

	ASCII Text	x
	Il-Soo Lee, Yu-Ting Lin, Anthony P. Ambler, "Reduction of Power and Test Time by Removing Cluster of Don?t-Care from Test Data Set," VLSI, IEEE Computer Society Annual Symposium on, pp. 255-256, IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05), 2005.

	BibTex	x
	@article{ 10.1109/ISVLSI.2005.63, author = {Il-Soo Lee and Yu-Ting Lin and Anthony P. Ambler}, title = {Reduction of Power and Test Time by Removing Cluster of Don?t-Care from Test Data Set}, journal ={VLSI, IEEE Computer Society Annual Symposium on}, volume = {0}, year = {2005}, isbn = {0-7695-2365-X}, pages = {255-256}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISVLSI.2005.63}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI, IEEE Computer Society Annual Symposium on TI - Reduction of Power and Test Time by Removing Cluster of Don?t-Care from Test Data Set SN - 0-7695-2365-X SP255 EP256 A1 - Il-Soo Lee, A1 - Yu-Ting Lin, A1 - Anthony P. Ambler, PY - 2005 KW - null VL - 0 JA - VLSI, IEEE Computer Society Annual Symposium on ER -

Il-Soo Lee, University of Texas at Austin

Yu-Ting Lin, University of Texas at Austin

Anthony P. Ambler, University of Texas at Austin

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISVLSI.2005.63

Reduction of power dissipation and test time is accomplished by forming two clusters of don?t-care inside an input and a response test cube, respectively. These clusters are out of the scan operation.

Citation:

Il-Soo Lee, Yu-Ting Lin, Anthony P. Ambler, "Reduction of Power and Test Time by Removing Cluster of Don?t-Care from Test Data Set," isvlsi, pp.255-256, IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05), 2005

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