16th IEEE International Symposium on Software Reliability Engineering (ISSRE'05) Minimization of Randomized Unit Test Cases Chicago, Illinois November 08-November 11 ISBN: 0-7695-2482-6
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISSRE.2005.28
We describe a framework for randomized unit testing, and give empirical evidence that generating unit test cases randomly and then minimizing the failing test cases results in significant benefits. Randomized generation of unit test cases (sequences of method calls) has been shown to allow high coverage and to be highly effective. However, failing test cases, if found, are often very long sequences of method calls. We show that Zeller and Hildebrandt?s test case minimization algorithm significantly reduces the length of these sequences. We study the resulting benefits qualitatively and quantitatively, via a case study on found open-source data structures and an experiment on lab-built data structures.
Citation:
Yong Lei, James H. Andrews, "Minimization of Randomized Unit Test Cases," issre, pp.267-276, 16th IEEE International Symposium on Software Reliability Engineering (ISSRE'05), 2005 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||