Using a Log-normal Failure Rate Distribution for Worst Case Bound Reliability Prediction

I
ISSRE
2003
14th International Symposium on Software Reliability Engineering
Abstract - Using a Log-normal Failure Rate Distribution for Worst Case Bound Reliability Prediction

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	Similar Articles Articles by Peter G. Bishop Articles by Robin E. Bloomfield

14th International Symposium on Software Reliability Engineering

Denver, Colorado

November 17-November 21

ISBN: 0-7695-2007-3

	ASCII Text	x
	Peter G. Bishop, Robin E. Bloomfield, "Using a Log-normal Failure Rate Distribution for Worst Case Bound Reliability Prediction," Software Reliability Engineering, International Symposium on, pp. 237, 14th International Symposium on Software Reliability Engineering, 2003.

	BibTex	x
	@article{ 10.1109/ISSRE.2003.1251046, author = {Peter G. Bishop and Robin E. Bloomfield}, title = {Using a Log-normal Failure Rate Distribution for Worst Case Bound Reliability Prediction}, journal ={Software Reliability Engineering, International Symposium on}, volume = {0}, year = {2003}, issn = {1071-9458}, pages = {237}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISSRE.2003.1251046}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Software Reliability Engineering, International Symposium on TI - Using a Log-normal Failure Rate Distribution for Worst Case Bound Reliability Prediction SN - 1071-9458 SP EP A1 - Peter G. Bishop, A1 - Robin E. Bloomfield, PY - 2003 KW - null VL - 0 JA - Software Reliability Engineering, International Symposium on ER -

Peter G. Bishop, Adelard and Centre for Software Reliability

Robin E. Bloomfield, Adelard and Centre for Software Reliability

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISSRE.2003.1251046

Prior research has suggested that the failure rates of faults follow a log normal distribution. We propose a specific model where distributions close to a log normal arise naturally from the program structure. The log normal distribution presents a problem when used in reliability growth models as it is not mathematically tractable. However we demonstrate that a worst case bound can be estimated that is less pessimistic than our earlier worst case bound theory.

Citation:

Peter G. Bishop, Robin E. Bloomfield, "Using a Log-normal Failure Rate Distribution for Worst Case Bound Reliability Prediction," issre, pp.237, 14th International Symposium on Software Reliability Engineering, 2003

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