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9th International Symposium on Quality Electronic Design (isqed 2008)
A Novel Test Generation Methodology for Adaptive Diagnosis
March 17-March 19
ISBN: 978-0-7695-3117-5
ASCII Text
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Rajsekhar Adapa, Edward Flanigan, Spyros Tragoudas, "A Novel Test Generation Methodology for Adaptive Diagnosis," Quality Electronic Design, International Symposium on, pp. 242-245, 9th International Symposium on Quality Electronic Design (isqed 2008), 2008.
 
 
BibTex
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@article{ 10.1109/ISQED.2008.79,
author = {Rajsekhar Adapa and Edward Flanigan and Spyros Tragoudas},
title = {A Novel Test Generation Methodology for Adaptive Diagnosis},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2008},
isbn = {978-0-7695-3117-5},
pages = {242-245},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.79},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - A Novel Test Generation Methodology for Adaptive Diagnosis
SN - 978-0-7695-3117-5
SP242
EP245
A1 - Rajsekhar Adapa,
A1 - Edward Flanigan,
A1 - Spyros Tragoudas,
PY - 2008
KW - Diagnosis
KW - Failure Analysis
KW - Test Generation
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -
 
This paper presents a automatic test pattern generationtechnique to improve the diagnostic resolution of a giventest set. Each test pattern generated by existing techniquesdetects a large number of faults. Identifying the faulty candidatefrom a large set of possible fault candidates is extremelydifficult and time consuming. A novel framework toadaptively generate additional patterns for diagnosing thefaulty location is presented. The additional patterns prunea set of fault free candidates from the possible fault candidates.The proposed technique improves the diagnostic resolutionwhere each new pattern detects only a small numberof faults and each fault is detected by few patterns. Theproposed method is applicable to any fault model and distinguishesa large number of faults with a small number ofpatterns. For simplicity we demonstrate the effectiveness ofthe approach on the path delay fault model.
Index Terms:
Diagnosis, Failure Analysis, Test Generation
Citation:
Rajsekhar Adapa, Edward Flanigan, Spyros Tragoudas, "A Novel Test Generation Methodology for Adaptive Diagnosis," isqed, pp.242-245, 9th International Symposium on Quality Electronic Design (isqed 2008), 2008
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