Dependence of Minimum Operating Voltage (VDDmin) on Block Size of 90-nm CMOS Ring Oscillators and its Implications in Low Power DFM

I
ISQED
2008
9th International Symposium on Quality Electronic Design (isqed 2008)
Abstract - Dependence of Minimum Operating Voltage (VDDmin) on Block Size of 90-nm CMOS Ring Oscillators and its Implications in Low Power DFM

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9th International Symposium on Quality Electronic Design (isqed 2008)

March 17-March 19

ISBN: 978-0-7695-3117-5

	ASCII Text	x
	Taro Niiyama, Piao Zhe, Koichi Ishida, Masami Murakata, Makoto Takamiya, Takayasu Sakurai, "Dependence of Minimum Operating Voltage (VDDmin) on Block Size of 90-nm CMOS Ring Oscillators and its Implications in Low Power DFM," Quality Electronic Design, International Symposium on, pp. 133-136, 9th International Symposium on Quality Electronic Design (isqed 2008), 2008.

	BibTex	x
	@article{ 10.1109/ISQED.2008.59, author = {Taro Niiyama and Piao Zhe and Koichi Ishida and Masami Murakata and Makoto Takamiya and Takayasu Sakurai}, title = {Dependence of Minimum Operating Voltage (VDDmin) on Block Size of 90-nm CMOS Ring Oscillators and its Implications in Low Power DFM}, journal ={Quality Electronic Design, International Symposium on}, volume = {0}, year = {2008}, isbn = {978-0-7695-3117-5}, pages = {133-136}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.59}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Quality Electronic Design, International Symposium on TI - Dependence of Minimum Operating Voltage (VDDmin) on Block Size of 90-nm CMOS Ring Oscillators and its Implications in Low Power DFM SN - 978-0-7695-3117-5 SP133 EP136 A1 - Taro Niiyama, A1 - Piao Zhe, A1 - Koichi Ishida, A1 - Masami Murakata, A1 - Makoto Takamiya, A1 - Takayasu Sakurai, PY - 2008 KW - null VL - 0 JA - Quality Electronic Design, International Symposium on ER -

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.59

The minimum operating voltage (VDDmin) of 90-nm CMOS ring oscillators (RO’s) is investigated in order to clarify the lower limit of supply voltage (VDD) for logic circuits. The measured VDDmin is determined by the intra-die threshold voltage random variations and increased from 91 mV to 224 mV when the number of RO stages increased from 11 to 1001, which hinders the VDD scaling. Lowering VDDmin is difficult, since it would require an impractical inverter-by-inverter adaptive body bias control. Therefore, the fine-grain adaptive VDD control will be more effective for the ultra low voltage logic circuits to reduce the power consumption.

Citation:

Taro Niiyama, Piao Zhe, Koichi Ishida, Masami Murakata, Makoto Takamiya, Takayasu Sakurai, "Dependence of Minimum Operating Voltage (VDDmin) on Block Size of 90-nm CMOS Ring Oscillators and its Implications in Low Power DFM," isqed, pp.133-136, 9th International Symposium on Quality Electronic Design (isqed 2008), 2008

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