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9th International Symposium on Quality Electronic Design (isqed 2008)
A Randomized Greedy Algorithm for the Pattern Fill Problem for DFM Applications
March 17-March 19
ISBN: 978-0-7695-3117-5
ASCII Text
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Maharaj Mukherjee, Kanad Chakraborty, "A Randomized Greedy Algorithm for the Pattern Fill Problem for DFM Applications," Quality Electronic Design, International Symposium on, pp. 344-347, 9th International Symposium on Quality Electronic Design (isqed 2008), 2008.
 
 
BibTex
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@article{ 10.1109/ISQED.2008.29,
author = {Maharaj Mukherjee and Kanad Chakraborty},
title = {A Randomized Greedy Algorithm for the Pattern Fill Problem for DFM Applications},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2008},
isbn = {978-0-7695-3117-5},
pages = {344-347},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.29},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - A Randomized Greedy Algorithm for the Pattern Fill Problem for DFM Applications
SN - 978-0-7695-3117-5
SP344
EP347
A1 - Maharaj Mukherjee,
A1 - Kanad Chakraborty,
PY - 2008
KW - null
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -
 
This work deals with the dummy fill and negative fill insertion problem with constraints on the minimum and maximum pattern density within a moving rectangular window. It is shown that the general class of such problems is at least NP-hard. A greedy randomized algorithm for this problem is proposed, and its proof of convergence and some experimental results are presented. More detailed account of our implementation and results are available in [7].
Citation:
Maharaj Mukherjee, Kanad Chakraborty, "A Randomized Greedy Algorithm for the Pattern Fill Problem for DFM Applications," isqed, pp.344-347, 9th International Symposium on Quality Electronic Design (isqed 2008), 2008
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