Sanjiv Taneja, "Plenary Speech 2P1: Consumerization of Electronics and Nanometer Technologies: Implications for Manufacturing Test," Quality Electronic Design, International Symposium on, pp. 585, 9th International Symposium on Quality Electronic Design (isqed 2008), 2008.

@article{ 10.1109/ISQED.2008.178,
author = {Sanjiv Taneja},
title = {Plenary Speech 2P1: Consumerization of Electronics and Nanometer Technologies: Implications for Manufacturing Test},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2008},
isbn = {978-0-7695-3117-5},
pages = {585},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.178},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - Plenary Speech 2P1: Consumerization of Electronics and Nanometer Technologies: Implications for Manufacturing Test
SN - 978-0-7695-3117-5
SP
EP
A1 - Sanjiv Taneja,
PY - 2008
KW - null
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -