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9th International Symposium on Quality Electronic Design (isqed 2008)
Characterizing the Impact of Substrate Noise on High-Speed Flash ADCs
March 17-March 19
ISBN: 978-0-7695-3117-5
ASCII Text
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Parastoo Nikaeen, Boris Murmann, Robert W. Dutton, "Characterizing the Impact of Substrate Noise on High-Speed Flash ADCs," Quality Electronic Design, International Symposium on, pp. 396-400, 9th International Symposium on Quality Electronic Design (isqed 2008), 2008.
 
 
BibTex
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@article{ 10.1109/ISQED.2008.141,
author = {Parastoo Nikaeen and Boris Murmann and Robert W. Dutton},
title = {Characterizing the Impact of Substrate Noise on High-Speed Flash ADCs},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2008},
isbn = {978-0-7695-3117-5},
pages = {396-400},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.141},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - Characterizing the Impact of Substrate Noise on High-Speed Flash ADCs
SN - 978-0-7695-3117-5
SP396
EP400
A1 - Parastoo Nikaeen,
A1 - Boris Murmann,
A1 - Robert W. Dutton,
PY - 2008
KW - flash ADC
KW - comparator
KW - substrate noise
KW - SNR
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -
 
A 4-bit flash ADC is investigated in presence of substrate noise generated by switching activities in digital blocks. The impact of noise is analyzed in different building blocks of the ADC and is measured experimentally using a high-speed ADC test block fabricated in a 0.18-μm SiGe BiCMOS process. Measurement results show that noise spikes in the substrate cause distortion in the prototype ADC and degrade its SNDR by 2 dB (10%) at noise frequencies above 200 MHz.
Index Terms:
flash ADC, comparator, substrate noise, SNR
Citation:
Parastoo Nikaeen, Boris Murmann, Robert W. Dutton, "Characterizing the Impact of Substrate Noise on High-Speed Flash ADCs," isqed, pp.396-400, 9th International Symposium on Quality Electronic Design (isqed 2008), 2008
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