Investigating the Design, Performance, and Reliability of Multi-Walled Carbon Nanotube Interconnect

I
ISQED
2008
9th International Symposium on Quality Electronic Design (isqed 2008)
Abstract - Investigating the Design, Performance, and Reliability of Multi-Walled Carbon Nanotube Interconnect

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	Similar Articles Articles by Arthur Nieuwoudt Articles by Yehia Massoud

9th International Symposium on Quality Electronic Design (isqed 2008)

March 17-March 19

ISBN: 978-0-7695-3117-5

	ASCII Text	x
	Arthur Nieuwoudt, Yehia Massoud, "Investigating the Design, Performance, and Reliability of Multi-Walled Carbon Nanotube Interconnect," Quality Electronic Design, International Symposium on, pp. 691-696, 9th International Symposium on Quality Electronic Design (isqed 2008), 2008.

	BibTex	x
	@article{ 10.1109/ISQED.2008.123, author = {Arthur Nieuwoudt and Yehia Massoud}, title = {Investigating the Design, Performance, and Reliability of Multi-Walled Carbon Nanotube Interconnect}, journal ={Quality Electronic Design, International Symposium on}, volume = {0}, year = {2008}, isbn = {978-0-7695-3117-5}, pages = {691-696}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.123}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Quality Electronic Design, International Symposium on TI - Investigating the Design, Performance, and Reliability of Multi-Walled Carbon Nanotube Interconnect SN - 978-0-7695-3117-5 SP691 EP696 A1 - Arthur Nieuwoudt, A1 - Yehia Massoud, PY - 2008 KW - Mutli-walled carbon nanotubes KW - nanotube interconnect KW - interconnect reliability KW - interconnect VL - 0 JA - Quality Electronic Design, International Symposium on ER -

Arthur Nieuwoudt

Yehia Massoud

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.123

In this paper, we develop a quantitative design technique for multi-walled carbon nanotube (MWCNT) based interconnect, which we utilize to examine the performance and reliability of future nanotube-based interconnect solutions. Leveraging an analytical RLC model for MWCNTs, we create the first closed-form formulation for the optimal nanotube diameter and nanotube bundle height. The results indicate that the proposed design method decreases delay by 21% and 29% on average compared to non-optimized MWCNTs and single-walled carbon nanotube (SWCNT) bundles. We also find that large diameter MWCNT bundles are significantly more susceptible to process variations than SWCNT bundles, which will have important reliability implications in future nano-scale ICs.

Index Terms:

Mutli-walled carbon nanotubes, nanotube interconnect, interconnect reliability, interconnect

Citation:

Arthur Nieuwoudt, Yehia Massoud, "Investigating the Design, Performance, and Reliability of Multi-Walled Carbon Nanotube Interconnect," isqed, pp.691-696, 9th International Symposium on Quality Electronic Design (isqed 2008), 2008

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