A Design Model for Random Process Variability

I
ISQED
2008
9th International Symposium on Quality Electronic Design (isqed 2008)
Abstract - A Design Model for Random Process Variability

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	Similar Articles Articles by Victoria Wang Articles by Kanak Agarwal Articles by Sani Nassif Articles by Kevin Nowka Articles by Dejan Markovic

9th International Symposium on Quality Electronic Design (isqed 2008)

March 17-March 19

ISBN: 978-0-7695-3117-5

	ASCII Text	x
	Victoria Wang, Kanak Agarwal, Sani Nassif, Kevin Nowka, Dejan Markovic, "A Design Model for Random Process Variability," Quality Electronic Design, International Symposium on, pp. 734-737, 9th International Symposium on Quality Electronic Design (isqed 2008), 2008.

	BibTex	x
	@article{ 10.1109/ISQED.2008.111, author = {Victoria Wang and Kanak Agarwal and Sani Nassif and Kevin Nowka and Dejan Markovic}, title = {A Design Model for Random Process Variability}, journal ={Quality Electronic Design, International Symposium on}, volume = {0}, year = {2008}, isbn = {978-0-7695-3117-5}, pages = {734-737}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.111}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Quality Electronic Design, International Symposium on TI - A Design Model for Random Process Variability SN - 978-0-7695-3117-5 SP734 EP737 A1 - Victoria Wang, A1 - Kanak Agarwal, A1 - Sani Nassif, A1 - Kevin Nowka, A1 - Dejan Markovic, PY - 2008 KW - random process variability KW - principal component analysis KW - modeling KW - current variation VL - 0 JA - Quality Electronic Design, International Symposium on ER -

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.111

A new approach to analyze process variation through measured current variation is introduced.??The methodology concludes with a simple and convenient posynomial model for random process variability to bridge the gap between existingstatistical methods and circuit design.??The model contains only design variables: transistor sizes W and L, and operating points Vgs and Vds.??Modeling random process variability in this way allows for adaptability to optimization problems, time efficient methods for gathering statistical information in comparison to Monte Carlo, and analternative equation for hand analysis.

Index Terms:

random process variability, principal component analysis, modeling, current variation

Citation:

Victoria Wang, Kanak Agarwal, Sani Nassif, Kevin Nowka, Dejan Markovic, "A Design Model for Random Process Variability," isqed, pp.734-737, 9th International Symposium on Quality Electronic Design (isqed 2008), 2008

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