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8th International Symposium on Quality Electronic Design (ISQED'07)
Intelligent Random Vector Generator Based on Probability Analysis of Circuit Structure
San Jose, California
March 26-March 28
ISBN: 0-7695-2795-7
Yu-Min Kuo, National Tsing Hua University, Taiwan
Cheng-Hung Lin, National Tsing Hua University, Taiwan
Chun-Yao Wang, National Tsing Hua University, Taiwan
Shih-Chieh Chang, National Tsing Hua University, Taiwan
Pei-Hsin Ho, Synopsys, Inc.
Design verification has become a bottleneck of modern designs. Recently, simulation-based random verification has attracted a lot of interests due to its effectiveness in uncovering obscure bugs. Designers are often required to provide the input probabilities while conducting the random verification. However, it is extremely difficult for designers to provide accurate input probabilities. In this paper, we propose an iterative algorithm that derives good input probabilities so that the design intent can be exercised effectively for functional verification. We conduct extensive experiments on both benchmark circuit and industrial designs. The experimental results are very promising.
Citation:
Yu-Min Kuo, Cheng-Hung Lin, Chun-Yao Wang, Shih-Chieh Chang, Pei-Hsin Ho, "Intelligent Random Vector Generator Based on Probability Analysis of Circuit Structure," isqed, pp.344-349, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007
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