8th International Symposium on Quality Electronic Design (ISQED'07) Intelligent Random Vector Generator Based on Probability Analysis of Circuit Structure San Jose, California March 26-March 28 ISBN: 0-7695-2795-7
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.91
Design verification has become a bottleneck of modern designs. Recently, simulation-based random verification has attracted a lot of interests due to its effectiveness in uncovering obscure bugs. Designers are often required to provide the input probabilities while conducting the random verification. However, it is extremely difficult for designers to provide accurate input probabilities. In this paper, we propose an iterative algorithm that derives good input probabilities so that the design intent can be exercised effectively for functional verification. We conduct extensive experiments on both benchmark circuit and industrial designs. The experimental results are very promising.
Citation:
Yu-Min Kuo, Cheng-Hung Lin, Chun-Yao Wang, Shih-Chieh Chang, Pei-Hsin Ho, "Intelligent Random Vector Generator Based on Probability Analysis of Circuit Structure," isqed, pp.344-349, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||