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8th International Symposium on Quality Electronic Design (ISQED'07)
Increasing Manufacturing Yield for Wideband RF CMOS LNAs in the Presence of Process Variations
San Jose, California
March 26-March 28
ISBN: 0-7695-2795-7
ASCII Text
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Arthur Nieuwoudt, Tamer Ragheb, Hamid Nejati, Yehia Massoud, "Increasing Manufacturing Yield for Wideband RF CMOS LNAs in the Presence of Process Variations," Quality Electronic Design, International Symposium on, pp. 801-806, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007.
 
 
BibTex
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@article{ 10.1109/ISQED.2007.89,
author = {Arthur Nieuwoudt and Tamer Ragheb and Hamid Nejati and Yehia Massoud},
title = {Increasing Manufacturing Yield for Wideband RF CMOS LNAs in the Presence of Process Variations},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2007},
isbn = {0-7695-2795-7},
pages = {801-806},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.89},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - Increasing Manufacturing Yield for Wideband RF CMOS LNAs in the Presence of Process Variations
SN - 0-7695-2795-7
SP801
EP806
A1 - Arthur Nieuwoudt,
A1 - Tamer Ragheb,
A1 - Hamid Nejati,
A1 - Yehia Massoud,
PY - 2007
KW - null
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -
 
Arthur Nieuwoudt, Rice University, USA
Tamer Ragheb, Rice University, USA
Hamid Nejati, Rice University, USA
Yehia Massoud, Rice University, USA
In this paper, we develop several design techniques for reducing the impact of manufacturing variations on integrated wideband low noise amplifiers (LNA). Utilizing an efficient modeling and automated design methodology, we investigate the sensitivity of LNA performance metrics to process variations and determine that the input impedance matching is particularly sensitive to perturbations in component values. Based on the sensitivity analysis, we leverage several design techniques to increase the reliability of LNA designs. To mitigate the impact of process variations on the input impedance matching, we add additional circuit elements and tunable capacitors to dynamically compensate for manufacturing variations after fabrication. The results indicate that the proposed design techniques can increase manufacturing yield by up to one order of magnitude for input impedance matching with only a 14% increase in noise figure.
Citation:
Arthur Nieuwoudt, Tamer Ragheb, Hamid Nejati, Yehia Massoud, "Increasing Manufacturing Yield for Wideband RF CMOS LNAs in the Presence of Process Variations," isqed, pp.801-806, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007
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