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8th International Symposium on Quality Electronic Design (ISQED'07)
San Jose, California
March 26-March 28
ISBN: 0-7695-2795-7
ASCII Text
x 
 
Joseph Sawicki, "Forging Tighter Connections Between Design and Manufacturing in the Nanometer Age," Quality Electronic Design, International Symposium on, pp. 560-566, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007.
 
 
BibTex
x
 
@article{ 10.1109/ISQED.2007.78,
author = {Joseph Sawicki},
title = {Forging Tighter Connections Between Design and Manufacturing in the Nanometer Age},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2007},
isbn = {0-7695-2795-7},
pages = {560-566},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.78},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - Forging Tighter Connections Between Design and Manufacturing in the Nanometer Age
SN - 0-7695-2795-7
SP560
EP566
A1 - Joseph Sawicki,
PY - 2007
KW - null
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -
 
Joseph Sawicki, Mentor Graphics
As we dive deeper into nanometer technologies,we must rethink the waywe design.Tools, techniques, and methods that once worked without fail cannot hold up at the 65 and 45 nanometer depths, making it more challenging than ever to achieve yield. In nanometer technology, DRC is not enough.
Citation:
Joseph Sawicki, "Forging Tighter Connections Between Design and Manufacturing in the Nanometer Age," isqed, pp.560-566, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007
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