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8th International Symposium on Quality Electronic Design (ISQED'07)
San Jose, California
March 26-March 28
ISBN: 0-7695-2795-7
ASCII Text
x 
 
Nagesh Nagapalli, "DFT and Test: Ensuring Product Quality," Quality Electronic Design, International Symposium on, pp. 5, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007.
 
 
BibTex
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@article{ 10.1109/ISQED.2007.63,
author = {Nagesh Nagapalli},
title = {DFT and Test: Ensuring Product Quality},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2007},
isbn = {0-7695-2795-7},
pages = {5},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.63},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - DFT and Test: Ensuring Product Quality
SN - 0-7695-2795-7
SP
EP
A1 - Nagesh Nagapalli,
PY - 2007
KW - null
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -
 
Once design changes are made for DFM/DFY, it is necessary to quantify their impact so that knowledge about yield contribution of different features can be fed back to design and DFM tools.Test presents an opportunity to close the loop by crafting test patterns to expose the defect prone features during automatic test pattern generation (ATPG) and by analyzing silicon failures through diagnosis to determine the features that are actually causing yield loss and their relative impact.
Citation:
Nagesh Nagapalli, "DFT and Test: Ensuring Product Quality," isqed, pp.5, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007
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