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8th International Symposium on Quality Electronic Design (ISQED'07)
Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications
San Jose, California
March 26-March 28
ISBN: 0-7695-2795-7
ASCII Text
x 
 
Amit Laknaur, Rui Xiao, Sai Durbha, Haibo Wang, "Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications," Quality Electronic Design, International Symposium on, pp. 501-506, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007.
 
 
BibTex
x
 
@article{ 10.1109/ISQED.2007.57,
author = {Amit Laknaur and Rui Xiao and Sai Durbha and Haibo Wang},
title = {Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2007},
isbn = {0-7695-2795-7},
pages = {501-506},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.57},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications
SN - 0-7695-2795-7
SP501
EP506
A1 - Amit Laknaur,
A1 - Rui Xiao,
A1 - Sai Durbha,
A1 - Haibo Wang,
PY - 2007
KW - null
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -
 
Amit Laknaur, Southern Illinois University, USA
Rui Xiao, Southern Illinois University, USA
Sai Durbha, Southern Illinois University, USA
Haibo Wang, Southern Illinois University, USA
This paper presents a novel window comparator circuit whose error threshold can be adaptively adjusted according to its input signal levels. It is ideal for analog online testing applications. Advantages of adaptive comparator error thresholds over constant or relative error thresholds in analog testing applications are discussed. Analytical equations for guiding the design of proposed comparator circuitry are derived. The proposed comparator circuit has been designed and fabricated using a CMOS 0.18? technology. Measurement results of the fabricated chip are presented.
Citation:
Amit Laknaur, Rui Xiao, Sai Durbha, Haibo Wang, "Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications," isqed, pp.501-506, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007
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