Cross Layer Error Exploitation for Aggressive Voltage Scaling

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8th International Symposium on Quality Electronic Design (ISQED'07)

San Jose, California

March 26-March 28

ISBN: 0-7695-2795-7

	ASCII Text	x
	Amin Khajeh Djahromi, Ahmed M. Eltawil, Fadi J. Kurdahi, Rouwaida Kanj, "Cross Layer Error Exploitation for Aggressive Voltage Scaling," Quality Electronic Design, International Symposium on, pp. 192-197, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007.

	BibTex	x
	@article{ 10.1109/ISQED.2007.53, author = {Amin Khajeh Djahromi and Ahmed M. Eltawil and Fadi J. Kurdahi and Rouwaida Kanj}, title = {Cross Layer Error Exploitation for Aggressive Voltage Scaling}, journal ={Quality Electronic Design, International Symposium on}, volume = {0}, year = {2007}, isbn = {0-7695-2795-7}, pages = {192-197}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.53}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Quality Electronic Design, International Symposium on TI - Cross Layer Error Exploitation for Aggressive Voltage Scaling SN - 0-7695-2795-7 SP192 EP197 A1 - Amin Khajeh Djahromi, A1 - Ahmed M. Eltawil, A1 - Fadi J. Kurdahi, A1 - Rouwaida Kanj, PY - 2007 KW - null VL - 0 JA - Quality Electronic Design, International Symposium on ER -

Amin Khajeh Djahromi, UC Irvine, USA

Ahmed M. Eltawil, UC Irvine, USA

Fadi J. Kurdahi, UC Irvine, USA

Rouwaida Kanj, IBM Austin Research Labs, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.53

This paper shows that by co-designing circuits and systems, considerable power savings are possible if the inherent data redundancy of candidate systems such as wireless is used to compensate for hardware failures. A comprehensive study of 6T SRAM failure modes is presented. The generated statistics are used to quantify a power savings of up to 17.5% for a case study of a 32 nm CMOS 3GPP WCDMA modem.

Citation:

Amin Khajeh Djahromi, Ahmed M. Eltawil, Fadi J. Kurdahi, Rouwaida Kanj, "Cross Layer Error Exploitation for Aggressive Voltage Scaling," isqed, pp.192-197, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007

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