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8th International Symposium on Quality Electronic Design (ISQED'07)
Assertion Checkers in Verification, Silicon Debug and In-Field Diagnosis
San Jose, California
March 26-March 28
ISBN: 0-7695-2795-7
Marc Boule, McGill University, Canada
Jean-Samuel Chenard, McGill University, Canada
Zeljko Zilic, McGill University, Canada
Assertion Based Design, and more specifically, Assertion Based Verification (ABV) is quickly gaining wide acceptance in the design community. Assertions are mainly targeted at functional verification during the design and verification phases. In this paper, we concentrate on the use of assertions in post-fabrication silicon debug. We develop tools that efficiently generate the checkers from assertions, for their inclusion in the debug phase. We also detail how a checker generator can be used as a means of circuit design for certain portions of self test circuits, and more generally the design of monitoring circuits. Efficient subset partitioning of checkers for a dedicated fixed-size reprogrammable logic area is developed for efficient use of dedicated debug hardware.
Citation:
Marc Boule, Jean-Samuel Chenard, Zeljko Zilic, "Assertion Checkers in Verification, Silicon Debug and In-Field Diagnosis," isqed, pp.613-620, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007
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