Gerhard Knoblinger, James W. Tschanz, Marcal Pol, "SUB-45nm Technology and Design Challenges," Quality Electronic Design, International Symposium on, pp. 3, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007.

@article{ 10.1109/ISQED.2007.153,
author = {Gerhard Knoblinger and James W. Tschanz and Marcal Pol},
title = {SUB-45nm Technology and Design Challenges},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2007},
isbn = {0-7695-2795-7},
pages = {3},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.153},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - SUB-45nm Technology and Design Challenges
SN - 0-7695-2795-7
SP
EP
A1 - Gerhard Knoblinger,
A1 - James W. Tschanz,
A1 - Marcal Pol,
PY - 2007
KW - null
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -