8th International Symposium on Quality Electronic Design (ISQED'07)
San Jose, California
March 26-March 28
ISBN: 0-7695-2795-7
Citation:
Gerhard Knoblinger, James W. Tschanz, Marcal Pol, "SUB-45nm Technology and Design Challenges," isqed, pp.3, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007
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