7th International Symposium on Quality Electronic Design (ISQED'06) On N-Detect Pattern Set Optimization San Jose, California March 27-March 29 ISBN: 0-7695-2523-7
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2006.94
In this paper, we illustrate that the traditional Ndetect ATPG is unoptimized in terms of the size of the generated pattern set. The optimization problem is formulated as a minimum covering problem. Integer Linear Programming (ILP) is applied to obtain an Ndetection ATPG pattern set with the minimum number of patterns. A heuristic method is also proposed to obtain sub-optimal solutions efficiently. Experimental results demonstrate that by using the proposed method, the number of N-detection patterns can be reduced by about 18% for N=3 and about 13% for N=5 without compromising N-detection objective.
Citation:
Yu Huang, "On N-Detect Pattern Set Optimization," isqed, pp.445-450, 7th International Symposium on Quality Electronic Design (ISQED'06), 2006 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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