Evaluation of Collapsing Methods for Fault Diagnosis

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7th International Symposium on Quality Electronic Design (ISQED'06)

San Jose, California

March 27-March 29

ISBN: 0-7695-2523-7

	ASCII Text	x
	Rajsekhar Adapa, Spyros Tragoudas, Maria K Michael, "Evaluation of Collapsing Methods for Fault Diagnosis," Quality Electronic Design, International Symposium on, pp. 439-444, 7th International Symposium on Quality Electronic Design (ISQED'06), 2006.

	BibTex	x
	@article{ 10.1109/ISQED.2006.62, author = {Rajsekhar Adapa and Spyros Tragoudas and Maria K Michael}, title = {Evaluation of Collapsing Methods for Fault Diagnosis}, journal ={Quality Electronic Design, International Symposium on}, volume = {0}, year = {2006}, isbn = {0-7695-2523-7}, pages = {439-444}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2006.62}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Quality Electronic Design, International Symposium on TI - Evaluation of Collapsing Methods for Fault Diagnosis SN - 0-7695-2523-7 SP439 EP444 A1 - Rajsekhar Adapa, A1 - Spyros Tragoudas, A1 - Maria K Michael, PY - 2006 KW - null VL - 0 JA - Quality Electronic Design, International Symposium on ER -

Rajsekhar Adapa, Southern Illinois University Carbondale

Spyros Tragoudas, Southern Illinois University Carbondale

Maria K Michael, University of Cyprus

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2006.62

This paper presents two new single stuck-at fault collapsing methods to reduce the number of tests required for fault diagnosis. The impact of the proposed collapsing methods on diagnosis is evaluated in terms of time and space requirements for the diagnosis process. Experimental comparisons on the ISCAS?85 benchmarks demonstrate the impact of the proposed generalization over the traditional fault collapsing method.

Citation:

Rajsekhar Adapa, Spyros Tragoudas, Maria K Michael, "Evaluation of Collapsing Methods for Fault Diagnosis," isqed, pp.439-444, 7th International Symposium on Quality Electronic Design (ISQED'06), 2006

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