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7th International Symposium on Quality Electronic Design (ISQED'06)
Dual-Vt Design of FPGAs for Subthreshold Leakage Tolerance
San Jose, California
March 27-March 29
ISBN: 0-7695-2523-7
Akhilesh Kumar, University of Waterloo, ON, Canada
Mohab Anis, University of Waterloo, ON, Canada
In this paper we propose a dual-Vt FPGA architecture for reduction of subthreshold leakage power. A CAD flow has been proposed based on the dual-Vt assignment algorithm and placement for realizing the dual-Vt FPGA architecture. Logic elements within the logic blocks are the candidates for dual-Vt assignment. We propose an architecture in which there are two kinds of logic blocks, one with all high-Vt logic elements and another with a fixed percentage of high-Vt logic elements. These two kinds of logic blocks are then placed in such a way that the FPGA architecture remains regular. Results indicate that in the ideal case of dual-Vt assignment, over 95% of the logic elements can be assigned high-Vt. Results show that leakage savings of 55% can be achieved. Design tradeoffs for various ratios of the two kinds of logic blocks are investigated. The dual-Vt FPGA CAD flow is intended for development and evaluation of dual-Vt FPGA architectures.
Citation:
Akhilesh Kumar, Mohab Anis, "Dual-Vt Design of FPGAs for Subthreshold Leakage Tolerance," isqed, pp.735-740, 7th International Symposium on Quality Electronic Design (ISQED'06), 2006
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