7th International Symposium on Quality Electronic Design (ISQED'06) Delay Fault Diagnosis for Non-Robust Test San Jose, California March 27-March 29 ISBN: 0-7695-2523-7
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2006.45
defects and parameter variations often cause design timing failures. It is essential that those errors be correctly and quickly diagnosed. The existing delay-fault diagnosis algorithms cannot identify the delay faults that require nonrobust tests, because they ignore non-robust propagation conditions while emulating the failure analyzer?s behavior. We propose a novel approach to perform delay-fault diagnosis for robust and non-robust tests. The experimental results show that our approach can diagnose delay faults with good resolution. It is stable with respect to delay variations that the failure analyzer might experience.
Citation:
Vishal J. Mehta, Malgorzata Marek-Sadowska, Zhiyuan Wang, Kun-Han Tsai, Janusz Rajski, "Delay Fault Diagnosis for Non-Robust Test," isqed, pp.463-472, 7th International Symposium on Quality Electronic Design (ISQED'06), 2006 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||