loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
7th International Symposium on Quality Electronic Design (ISQED'06)
Constant Impedance Scaling Paradigm for Scaling LC transmission lines
San Jose, California
March 27-March 29
ISBN: 0-7695-2523-7
ASCII Text
x 
 
J. Balachandran, S. Brebels, G. Carchon, W.De Raedt, E. Beyne, M. Kuijk, B. Nauwelaers, "Constant Impedance Scaling Paradigm for Scaling LC transmission lines," Quality Electronic Design, International Symposium on, pp. 387-392, 7th International Symposium on Quality Electronic Design (ISQED'06), 2006.
 
 
BibTex
x
 
@article{ 10.1109/ISQED.2006.38,
author = {J. Balachandran and S. Brebels and G. Carchon and W.De Raedt and E. Beyne and M. Kuijk and B. Nauwelaers},
title = {Constant Impedance Scaling Paradigm for Scaling LC transmission lines},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2006},
isbn = {0-7695-2523-7},
pages = {387-392},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2006.38},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - Constant Impedance Scaling Paradigm for Scaling LC transmission lines
SN - 0-7695-2523-7
SP387
EP392
A1 - J. Balachandran,
A1 - S. Brebels,
A1 - G. Carchon,
A1 - W.De Raedt,
A1 - E. Beyne,
A1 - M. Kuijk,
A1 - B. Nauwelaers,
PY - 2006
KW - null
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -
 
J. Balachandran, Microwave and RF Systems Group, IMEC vzw, Kapeldreef 75, 3001, Leuven, Belgium
S. Brebels, Microwave and RF Systems Group, IMEC vzw, Kapeldreef 75, 3001, Leuven, Belgium
G. Carchon, Microwave and RF Systems Group, IMEC vzw, Kapeldreef 75, 3001, Leuven, Belgium
W.De Raedt, Microwave and RF Systems Group, IMEC vzw, Kapeldreef 75, 3001, Leuven, Belgium
E. Beyne, Microwave and RF Systems Group, IMEC vzw, Kapeldreef 75, 3001, Leuven, Belgium
M. Kuijk, Vrije Universiteit Brussel,ETRO, Pleinlaan 2,1050 Brussel, Belgium
B. Nauwelaers, Katholieke Universiteit Leuven, ESAT, Kasteelpark Arenberg 10, 3001 Leuven, Belgium.
Reverse scaled LC transmission lines are an effective alternative to on-chip global interconnects which severely limit the chip performance in nano-CMOS technologies. However, the main disadvantage of the LC transmission line approach is their poor wiring density. The scaling of LC transmission lines is formally analyzed with the proposed constant impedance scaling paradigm that simultaneously maximize performance and wiring density. With this paradigm, we show that the LC transmission line implementation would need a minimum pitch of 8um for line lengths in the range of 10 to 20 mm, considering a low-k dielectric of relative dielectric constant of 2.7.
Citation:
J. Balachandran, S. Brebels, G. Carchon, W.De Raedt, E. Beyne, M. Kuijk, B. Nauwelaers, "Constant Impedance Scaling Paradigm for Scaling LC transmission lines," isqed, pp.387-392, 7th International Symposium on Quality Electronic Design (ISQED'06), 2006
Usage of this product signifies your acceptance of the Terms of Use.