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7th International Symposium on Quality Electronic Design (ISQED'06)
San Jose, California
March 27-March 29
ISBN: 0-7695-2523-7
ASCII Text
x 
 
Keith Bowman, Michael Orshansky, Sachin S. Sapatnekar, "Tutorial II: Variability and Its Impact on Design," Quality Electronic Design, International Symposium on, pp. 5, 7th International Symposium on Quality Electronic Design (ISQED'06), 2006.
 
 
BibTex
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@article{ 10.1109/ISQED.2006.141,
author = {Keith Bowman and Michael Orshansky and Sachin S. Sapatnekar},
title = {Tutorial II: Variability and Its Impact on Design},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2006},
isbn = {0-7695-2523-7},
pages = {5},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2006.141},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - Tutorial II: Variability and Its Impact on Design
SN - 0-7695-2523-7
SP
EP
A1 - Keith Bowman,
A1 - Michael Orshansky,
A1 - Sachin S. Sapatnekar,
PY - 2006
KW - null
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -
 
Keith Bowman, Intel Corporation
Michael Orshansky, University of Texas-Austin
Sachin S. Sapatnekar, University of Minnesota
As digital designs scale down into the sub-100nm regime, the effects of variations are seen to dramatically affect the behavior of the circuit. These may arise from.
Citation:
Keith Bowman, Michael Orshansky, Sachin S. Sapatnekar, "Tutorial II: Variability and Its Impact on Design," isqed, pp.5, 7th International Symposium on Quality Electronic Design (ISQED'06), 2006
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