Sixth International Symposium on Quality of Electronic Design (ISQED'05) Functions for Quality Transition Fault Tests San Jose, California March 21-March 23 ISBN: 0-7695-2301-3
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2005.60
It is shown how to generate a function that contains all possible tests to detect a transition fault. Moreover, a systematic methodology is presented, that derives the functions for all transition faults based on only two circuit traversals. Quality tests are generated by requiring that the function formulation considers established sensitization criteria to either activate a transition at the fault site or propagate it to a circuit output. Experimental results on the ISCAS'85 and ISCAS'89 benchmarks demonstrate the promise of the method which can also lead to efficient compaction methods for transition faults.
Citation:
Maria K. Michael, Stelios Neophytou, Spyros Tragoudas, "Functions for Quality Transition Fault Tests," isqed, pp.327-332, Sixth International Symposium on Quality of Electronic Design (ISQED'05), 2005 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||