Sixth International Symposium on Quality of Electronic Design (ISQED'05) Analysis and Optimization of Static Power Considering Transition Dependency of Leakage Current in VLSI Circuits San Jose, California March 21-March 23 ISBN: 0-7695-2301-3
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2005.18
We show that leakage current in VLSI circuits is not only a function of the current state (input combination) of a combinational circuit but also is dependent on the state history (previous input combinations.) As an example application of the transition-dependent leakage model, we extend a known technique for calculating and applying the minimum leakage input vector to a combinational circuit in the standby mode to one which calculates and applies a pair of input vectors to initialize the circuit to the minimum leakage configuration.
Citation:
Afshin Abdollahi, Farzan Fallah, Massoud Pedram, "Analysis and Optimization of Static Power Considering Transition Dependency of Leakage Current in VLSI Circuits," isqed, pp.77-82, Sixth International Symposium on Quality of Electronic Design (ISQED'05), 2005 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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