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Sixth International Symposium on Quality of Electronic Design (ISQED'05)
An ILP Formulation for Reliability-Oriented High-Level Synthesis
San Jose, California
March 21-March 23
ISBN: 0-7695-2301-3
ASCII Text
x 
 
S. Tosun, O. Ozturk, N. Mansouri, E. Arvas, M. Kandemir, Y. Xie, W-L. Hung, "An ILP Formulation for Reliability-Oriented High-Level Synthesis," Quality Electronic Design, International Symposium on, pp. 364-369, Sixth International Symposium on Quality of Electronic Design (ISQED'05), 2005.
 
 
BibTex
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@article{ 10.1109/ISQED.2005.15,
author = {S. Tosun and O. Ozturk and N. Mansouri and E. Arvas and M. Kandemir and Y. Xie and W-L. Hung},
title = {An ILP Formulation for Reliability-Oriented High-Level Synthesis},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2005},
isbn = {0-7695-2301-3},
pages = {364-369},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2005.15},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - An ILP Formulation for Reliability-Oriented High-Level Synthesis
SN - 0-7695-2301-3
SP364
EP369
A1 - S. Tosun,
A1 - O. Ozturk,
A1 - N. Mansouri,
A1 - E. Arvas,
A1 - M. Kandemir,
A1 - Y. Xie,
A1 - W-L. Hung,
PY - 2005
KW - null
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -
 
S. Tosun, Syracuse University
O. Ozturk, Pennsylvania State University
N. Mansouri, Syracuse University
E. Arvas, Syracuse University
M. Kandemir, Pennsylvania State University
Y. Xie, Pennsylvania State University
W-L. Hung, Pennsylvania State University
Reliability decisions taken early in system design can bring significant benefits in terms of design quality. This paper presents a 0-1 integer linear programming (ILP) formulation for reliability-oriented high-level synthesis that addresses the soft error problem. The proposed approach tries to maximize reliability of the design while observing the bounds on area and performance, and makes use of our reliability characterization of hardware components such as adders and multipliers. We implemented the proposed approach, performed experiments with several example designs, and compared the results with those obtained by a prior proposal. Our results show that incorporating reliability as a first-class metric during high-level synthesis brings significant improvements on the overall design reliability.
Citation:
S. Tosun, O. Ozturk, N. Mansouri, E. Arvas, M. Kandemir, Y. Xie, W-L. Hung, "An ILP Formulation for Reliability-Oriented High-Level Synthesis," isqed, pp.364-369, Sixth International Symposium on Quality of Electronic Design (ISQED'05), 2005
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