Using MUXs Network to Hide Bunches of Scan Chains

I
ISQED
2005
Sixth International Symposium on Quality of Electronic Design (ISQED'05)
Abstract - Using MUXs Network to Hide Bunches of Scan Chains

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Sixth International Symposium on Quality of Electronic Design (ISQED'05)

San Jose, California

March 21-March 23

ISBN: 0-7695-2301-3

	ASCII Text	x
	Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, "Using MUXs Network to Hide Bunches of Scan Chains," Quality Electronic Design, International Symposium on, pp. 238-243, Sixth International Symposium on Quality of Electronic Design (ISQED'05), 2005.

	BibTex	x
	@article{ 10.1109/ISQED.2005.127, author = {Yinhe Han and Yu Hu and Huawei Li and Xiaowei Li}, title = {Using MUXs Network to Hide Bunches of Scan Chains}, journal ={Quality Electronic Design, International Symposium on}, volume = {0}, year = {2005}, isbn = {0-7695-2301-3}, pages = {238-243}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2005.127}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Quality Electronic Design, International Symposium on TI - Using MUXs Network to Hide Bunches of Scan Chains SN - 0-7695-2301-3 SP238 EP243 A1 - Yinhe Han, A1 - Yu Hu, A1 - Huawei Li, A1 - Xiaowei Li, PY - 2005 KW - null VL - 0 JA - Quality Electronic Design, International Symposium on ER -

Yinhe Han, Chinese Academy of Sciences, Beijing; Graduate School of Chinese Academy of Sciences, Beijing

Yu Hu, Chinese Academy of Sciences, Beijing

Huawei Li, Chinese Academy of Sciences, Beijing; Graduate School of Chinese Academy of Sciences, Beijing

Xiaowei Li, Chinese Academy of Sciences, Beijing; Graduate School of Chinese Academy of Sciences, Beijing

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2005.127

This paper presents a decompression architecture using a periodically alterable MUX network. Compared to static XORs network, the periodically alterable MUXs network has multiple configurations to decode the input information flexibly. Probability analysis can help us to select the proper parameter when considering the DFT schemes. With the dedicated efforts, the smaller test data volume and test application time can be achieved compared to previous techniques.

Citation:

Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, "Using MUXs Network to Hide Bunches of Scan Chains," isqed, pp.238-243, Sixth International Symposium on Quality of Electronic Design (ISQED'05), 2005

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