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5th International Symposium on Quality Electronic Design (ISQED'04)
Low Power Testing by Test Vector Ordering with Vector Repetition
San Jose, California
March 22-March 24
ISBN: 0-7695-2093-6
ASCII Text
x 
 
M. Bellos, D. Bakalis, D. Nikolos, X. Kavousianos, "Low Power Testing by Test Vector Ordering with Vector Repetition," Quality Electronic Design, International Symposium on, pp. 205-210, 5th International Symposium on Quality Electronic Design (ISQED'04), 2004.
 
 
BibTex
x
 
@article{ 10.1109/ISQED.2004.1283674,
author = {M. Bellos and D. Bakalis and D. Nikolos and X. Kavousianos},
title = {Low Power Testing by Test Vector Ordering with Vector Repetition},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2004},
issn = {2003116307},
pages = {205-210},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2004.1283674},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - Low Power Testing by Test Vector Ordering with Vector Repetition
SN - 2003116307
SP205
EP210
A1 - M. Bellos,
A1 - D. Bakalis,
A1 - D. Nikolos,
A1 - X. Kavousianos,
PY - 2004
KW - null
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -
 
M. Bellos, University of Patras and Research Academic Computer Technology Institute
D. Bakalis, University of Patras and Research Academic Computer Technology Institute
D. Nikolos, University of Patras and Research Academic Computer Technology Institute
X. Kavousianos, University of Ioannina
Test vector ordering with vector repetition has been presented as a method to reduce the average as well as the peak power dissipation of a circuit during testing. Based on this method, in this paper we present some techniques that can be used to further reduce the average power dissipation. Experimental results validate that the proposed techniques achieve considerable savings in energy and average power dissipation while reducing the length of the resulting test sequences compared to the original method.
Citation:
M. Bellos, D. Bakalis, D. Nikolos, X. Kavousianos, "Low Power Testing by Test Vector Ordering with Vector Repetition," isqed, pp.205-210, 5th International Symposium on Quality Electronic Design (ISQED'04), 2004
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