New Test Access for High Resolution SD ADC's by Using the Noise Transfer Function Evaluation

I
ISQED
2004
5th International Symposium on Quality Electronic Design (ISQED'04)
Abstract - New Test Access for High Resolution SD ADC's by Using the Noise Transfer Function Evaluation

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5th International Symposium on Quality Electronic Design (ISQED'04)

San Jose, California

March 22-March 24

ISBN: 0-7695-2093-6

	ASCII Text	x
	Daniela De Venuto, "New Test Access for High Resolution SD ADC's by Using the Noise Transfer Function Evaluation," Quality Electronic Design, International Symposium on, pp. 81-85, 5th International Symposium on Quality Electronic Design (ISQED'04), 2004.

	BibTex	x
	@article{ 10.1109/ISQED.2004.1283654, author = {Daniela De Venuto}, title = {New Test Access for High Resolution SD ADC's by Using the Noise Transfer Function Evaluation}, journal ={Quality Electronic Design, International Symposium on}, volume = {0}, year = {2004}, issn = {2003116307}, pages = {81-85}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2004.1283654}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Quality Electronic Design, International Symposium on TI - New Test Access for High Resolution SD ADC's by Using the Noise Transfer Function Evaluation SN - 2003116307 SP81 EP85 A1 - Daniela De Venuto, PY - 2004 KW - null VL - 0 JA - Quality Electronic Design, International Symposium on ER -

Daniela De Venuto, Politecnico di Bari

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2004.1283654

A new solution to improve the testability of high resolution ΣΔ Analogue to Digital Converters (ΣΔ ADC's) using the quantizer input as test node is described. Both, the theory of the method and results from high level simulations for a 16 bit audio ADC example are presented. The analysis demonstrates the potential to reduce the computation overhead associated with test response analysis versus conventional techniques.

Citation:

Daniela De Venuto, "New Test Access for High Resolution SD ADC's by Using the Noise Transfer Function Evaluation," isqed, pp.81-85, 5th International Symposium on Quality Electronic Design (ISQED'04), 2004

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