Comparative Assessment of Adaptive Body-Bias SOI Pass-Transistor Logic

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	Similar Articles Articles by Geun Rae Cho Articles by Tom Chen

Fourth International Symposium on Quality Electronic Design

San Jose, California

March 24-March 26

ISBN: 0-7695-1881-8

	ASCII Text	x
	Geun Rae Cho, Tom Chen, "Comparative Assessment of Adaptive Body-Bias SOI Pass-Transistor Logic," Quality Electronic Design, International Symposium on, pp. 55, Fourth International Symposium on Quality Electronic Design, 2003.

	BibTex	x
	@article{ 10.1109/ISQED.2003.1194709, author = {Geun Rae Cho and Tom Chen}, title = {Comparative Assessment of Adaptive Body-Bias SOI Pass-Transistor Logic}, journal ={Quality Electronic Design, International Symposium on}, volume = {0}, year = {2003}, isbn = {0-7695-1881-8}, pages = {55}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2003.1194709}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Quality Electronic Design, International Symposium on TI - Comparative Assessment of Adaptive Body-Bias SOI Pass-Transistor Logic SN - 0-7695-1881-8 SP EP A1 - Geun Rae Cho, A1 - Tom Chen, PY - 2003 KW - null VL - 0 JA - Quality Electronic Design, International Symposium on ER -

Geun Rae Cho, Colorado State University

Tom Chen, Colorado State University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2003.1194709

We present a silicon-on-insulator (SOI) pass-transistor logic (PTL) gate with an active body bias control circuit and compare the proposed PTL gate with other types of PTL gates with different body bias circuits in two different 0:13?m SOI CMOS technologies. The experimental results show that the proposed SOI PTL gate using the body bias controlled technique is superior in terms of performance and power consumption than other DTMOS PTL gates.

Citation:

Geun Rae Cho, Tom Chen, "Comparative Assessment of Adaptive Body-Bias SOI Pass-Transistor Logic," isqed, pp.55, Fourth International Symposium on Quality Electronic Design, 2003

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