"Integrating Yield, Test and Reliability: "Statistical Models with Applications to Test and Burn-in Optimization"," Quality Electronic Design, International Symposium on, pp. 7, Fourth International Symposium on Quality Electronic Design, 2003.

@article{ 10.1109/ISQED.2003.10006,
author = {},
title = {Integrating Yield, Test and Reliability: "Statistical Models with Applications to Test and Burn-in Optimization"},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2003},
isbn = {0-7695-1881-8},
pages = {7},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2003.10006},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - Integrating Yield, Test and Reliability: "Statistical Models with Applications to Test and Burn-in Optimization"
SN - 0-7695-1881-8
SP
EP
PY - 2003
KW - null
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -