"Overview of Reliability Issues in Deep Sub-Micron Digital CMOS Technology and Their Interaction with Circuit Design Considerations," Quality Electronic Design, International Symposium on, pp. 12, Fourth International Symposium on Quality Electronic Design, 2003.

@article{ 10.1109/ISQED.2003.10001,
author = {},
title = {Overview of Reliability Issues in Deep Sub-Micron Digital CMOS Technology and Their Interaction with Circuit Design Considerations},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2003},
isbn = {0-7695-1881-8},
pages = {12},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2003.10001},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - Overview of Reliability Issues in Deep Sub-Micron Digital CMOS Technology and Their Interaction with Circuit Design Considerations
SN - 0-7695-1881-8
SP
EP
PY - 2003
KW - null
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -